Built-in Self Test of RF Subsystems with Integrated Detectors

Abstract

This paper describes a built-in self test technique for RF subsystems, using low-overhead on-chip detectors to calculate circuit specifications. A novel on-chip amplitude detector has been designed and optimized for RF circuit specification test. The detector has small area overhead with a low-frequency output. A test chip was fabricated in a commercial 0.18 μm CMOS process. By using on-chip detectors in a loopback setup, both the system performance and specifications of the individual components can be accurately measured. Measurements show accurate prediction of system and component specifications.