Built-in dynamic current sensor circuit for digital VLSI CMOS testing

Abstract

IDDQ testing is a powerful strategy for detecting defects that do not alter the logic behaviour of CMOS ICs. Such a technique is very effective especially in the detection of bridging defects although some open defects can be also detected. However, an important set of open defects escapes quiescent power supply current testing because they prevent any current elevation. As a solution, dynamic current testing is investigated. A built-in dynamic current sensor is proposed.