Abstract
A broadband microwave spectrometer has been constructed to determine the complex conductivity of thin metal films at frequencies from 45 MHz to 20 GHz working in the temperature range from 0.45 K to 2 K (in a (3)He cryostat). The setup follows the Corbino approach: a vector network analyzer measures the complex reflection coefficient of a microwave signal hitting the sample as termination of a coaxial transmission line. As the calibration of the setup limits the achievable resolution, we discuss the sources of error hampering different types of calibration. Test measurements of the complex conductivity of a heavy-fermion material demonstrate the applicability of the calibration procedures.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
