Abstract
Morphology evolution of thin film growth can be quantitatively modeled by employing rate equations for two-dimensional, single-valued functions within a treatment of small perturbations. This description can be expected to be valid in an intermediate film thickness regime, where substrate influences and three-dimensional effects are minor. The breakdown of the mathematical description in its upper film thickness limit is systematically investigated by a detailed comparison of experiments and simulation. Possible reasons for the failure are discussed and improvements are suggested.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
