Abstract
Partial implementation of boundary-scan IEEE 1149.1 at the board level has a negative effect on testability issues, economics, and total system functionality. An integrated circuit, which will allow boundary-scan architecture to interface with non-boundary-scan parts was designed to increase observability and detectability electronically. The solution offers an opportunity to fuse old and new silicon technologies into a single, hierarchical test strategy. The authors discuss the functionality, technology, and economics of a 1.25 mu m CMOS application specific IC, the PROBE. The ASIC can be used to regain observability lost to higher gate-to-pin ratios and packaging density. The economic feasibility is driven by how rapidly present designs are moving forward. Successful application depends heavily on the adoption of 1149.1. >
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