Abstract
AbstractAntenna characterization measurements are traditionally performed in the frequency domain (FD) through vector network analyzers (VNAs) in anechoic chambers. Nevertheless, the expensiveness of these facilities limits the possibility of using this approach for routine measurements. In this chapter, the strategies for the accurate evaluation of the reflection scattering parameter (S 11(f)) of antennas, starting from simple time domain reflectometry (TDR) measurements, are described. As a matter of fact, not only are instruments operating in time domain (TD) usually less expensive than VNAs; but they allow performing time windowing, which is the key for excluding the unwanted spurious reflection from the environment, thus avoiding the use of anechoic chamber.KeywordsTime WindowVector Network AnalyzerAnechoic ChamberOptimal Time WindowGood Frequency ResolutionThese keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
Published Version
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