Abstract

Bulk GaAs1 - xBix/GaAs alloys with various bismuth compositions are studied using power- and temperature-dependent photoluminescence (PL), Raman scattering, and atomic force microscopy (AFM). PL measurements exhibit that the bandgap of the alloy decreases with increasing bismuth composition. Moreover, PL peak energy and PL characteristic are found to be excitation intensity dependent. The PL signal is detectable below 150 K at low excitation intensities, but quenches at higher temperatures. As excitation intensity is increased, PL can be observable at room temperature and PL peak energy blueshifts. The quenching temperature of the PL signal tends to shift to higher temperatures with increasing bismuth composition, giving rise to an increase in Bi-related localization energy of disorders. The composition dependence of the PL is also found to be power dependent, changing from about 63 to 87 meV/Bi% as excitation intensity is increased. In addition, S-shaped temperature dependence at low excitation intensities is observed, a well-known signature of localized levels above valence band. Applying Varshni’s law to the temperature dependence of the PL peak energy, the concentration dependence of Debye temperature (β) and thermal expansion coefficient (α) are determined. AFM observations show that bismuth islands are randomly distributed on the surface and the diameter of the islands tends to increase with increasing bismuth composition. Raman scattering spectra show that incorporation of Bi into GaAs causes a new feature at around 185 cm-1 with slightly increasing Raman intensity as the Bi concentration increases. A broad feature located between 210 and 250 cm-1 is also observed and its intensity increases with increasing Bi content. Furthermore, the forbidden transverse optical (TO) mode becomes more pronounced for the samples with higher bismuth composition, which can be attributed to the effect of Bi-induced disorders on crystal symmetry.PACS78.55Cr 78.55-m 78.20-e 78.30-j

Highlights

  • It has been realized that the incorporation of a small percentage of bismuth (Bi) into GaAs results in a drastic decrease of bandgap energy, making GaAsBi a promising alloy for device applications operating in the near-infrared region [1,2]

  • We have studied molecular beam epitaxy (MBE)-grown bulk GaAsBi/GaAs samples with various bismuth compositions using temperature- and intensity-dependent photoluminescence (PL), atomic force microscopy (AFM), and Raman spectroscopy

  • 1.30 x=0.012 x=0.018 x=0.023 x=0.030 Varshni fit Results and discussion Figure 1a shows that the bandgap of GaAsBi red shifts with increasing Bi composition due to the stronger interaction between valence band and localized Bi level [8]

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Summary

Introduction

It has been realized that the incorporation of a small percentage of bismuth (Bi) into GaAs results in a drastic decrease of bandgap energy, making GaAsBi a promising alloy for device applications operating in the near-infrared region [1,2]. Spin-orbit splitting energy has been found to increase with increasing Bi content, thereby establishing GaAsBi as a promising alloy for spintronic applications [3]. GaAsBi can growth conditions to enhance the optical and electrical quality of the alloy is still a challenge. We have studied molecular beam epitaxy (MBE)-grown bulk GaAsBi/GaAs samples with various bismuth compositions using temperature- and intensity-dependent photoluminescence (PL), atomic force microscopy (AFM), and Raman spectroscopy

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