Abstract
Single-phase, magnetically uniaxial Gd <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3-x</inf> Bi <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">x</inf> Fe <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">5-y</inf> Al <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">y</inf> O <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">12</inf> films have been prepared by RF diode sputtering with RF substrate bias on single-crystal (Gd,Ca,Mg) <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</inf> (Ga,Zr) <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">5</inf> O <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">12</inf> and amorphous substrates. Epitaxial growth is observed by annealing of amorphous films for lattice misfits <0.03Å (tensile stress). Intrinsic properties, such as lattice constant, saturation magnetization, and polar magnetooptic effects, compare well with liquid-phase epitaxial films of equal composition. Film imperfections originating from particles expelled from the ceramic targets cause some optical loss, increased coercivity and increased linewidth in X-ray diffraction.
Published Version
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