Abstract
Plastic deformation study of Bi 2 Te 3 -related materials was performed. The ingots were grown by the Bridgman method using source materials with nominal compositions of Bi 0 . 5 Sb 1 . 5 Te 3 , Bi 2 Sb 2 . 8 5 Se 0 . 1 5 and Bi 1 . 8 Sb 0 . 2 Te 2 . 8 5 Se 0 . 1 5 . Disks were cut from the ingots, and were then deformed by either cold-pressing or by hot-pressing under pulse current heating. The crystal structures of the deformed samples were identified by X-ray diffraction. All diffraction peaks were assigned to the Bi 2 Te 3 structure, and the diffraction patterns indicate that the surfaces and bottoms of the samples were highly oriented in the hexagonal (00-l) plane. Hall effect measurements show the carrier concentration of the samples to be at an order of magnitude of 10 2 5 m - 3 at room temperature. The power factor for the samples after hot-press deformation exceeded that for the original ingots. The results suggest that hot-press deformation enhances the thermoelectric properties of Bi 2 Te 3 -related materials.
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