Abstract
AbstractThe localized electrical conduction behaviour of a resistive switching TiO2 film was examined by conductive atomic force microscopy (CAFM). Localized filamentary electrical conduction was well resolved with a negative tip bias with respect to the Pt bottom electrode whereas almost uniform electrical conduction was observed with a positive bias. The bias dependence of the CAFM result was attributed to local electrochemical reactions mediated by the high electric field near the CAFM tip. A positive tip bias extended the electrically conducting area much more than the actual tip–surface contact area presumably due to facilitated oxygen loss by the high electric field. (© 2010 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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