Abstract
We study the electrical detection of spin accumulation at a ferromagnet-silicon interface, which can be verified by measuring a Hanle effect in three-terminal lateral devices. The device structures used consist of a semiconducting Si channel and a Schottky tunnel contact. In a low current-bias region, the Hanle-effect curves are observed only under forward bias conditions. This can be considered that the electrical detectability at the forward-biased contact is higher than that at the reverse-biased contact. This is possible evidence for the detection of spin-polarized electrons created in a Si channel.
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