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https://doi.org/10.1109/smicnd.1995.494899
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Cite Publication Date: Oct 11, 1995 |
Affiliation: Research Institute for Analytical Instrumentation
The behaviour of two types of plastic encapsulated devices (complementary NPN and PNP transistors) in salt mist and cycling salt mist tests was studied. The results show that cycling salt mist test accelerates the salt mist test and the acceleration factors were calculated for the degradation mechanisms involved.
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