Abstract
In large IGBT modules, IGBT chips are normally paralleled to give the current ratings required. Current sharing between these individual chips has previously been investigated for normal switching operation. In this paper, current sharing during short circuit conditions is studied. The test rig is described and test results are given. The oscillation in the short circuit currents, observed at particular voltages, is also analysed.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
