Abstract
The long-term hygrothermal aging will induce the irreversible damages of epoxy-based anisotropic conductive film (ACF) joints. In this study, hygrothermal environment tests were used to accelerate the degradation of ACF joints in Chip-on-Glass (COG) assemblies. The effects of aging on adhesion strengths were measured by shear mode tests and changes of molecular conformation of ACF material were analyzed by Fourier Transform Infrared Spectroscopy (FTIR). Also, the fracture surfaces of ACF joints were investigated by Scanning Electronic Microscope (SEM). The results show that the ACF adhesion strengths decrease with aging; some chemical modifications occur in the aged ACF joints; the fracture failure mechanisms change with the hygrothermal aging.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.