Abstract
New repairable systems are generally subjected to development programs in order to improve system reliability before starting mass production. This paper proposes a Bayesian approach to analyze failure data from repairable systems undergoing a Test-Find-Test program. The system failure process in each testing stage is modeled using a Power-Law Process (PLP). Information on the effect of design modifications introduced into the system before starting a new testing stage is used, together with the posterior density of the PLP parameters at the current stage, to formalize the prior density at the beginning of the new stage. Contrary to the usual assumption, in this paper the PLP parameters are assumed to be dependent random variables. The system reliability is measured in terms of the number of failures that will occur in a batch of new units in a given time interval, for example the warranty period. A numerical example is presented to illustrate the proposed procedure.
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call