Bayesian Additive Machine: classification with a semiparametric discriminant function

Abstract

In this paper, we propose a new Bayesian inference approach for classification based on the traditional hinge loss used for classical support vector machines, which we call the Bayesian Additive Machine (BAM). Unlike existing approaches, the new model has a semiparametric discriminant function where some feature effects are nonlinear and others are linear. This separation of features is achieved automatically during model fitting without user pre-specification. Following the literature on sparse regression of high-dimensional models, we can also identify the irrelevant features. By introducing spike-and-slab priors using two sets of indicator variables, these multiple goals are achieved simultaneously and automatically, without any parameter tuning such as cross-validation. An efficient partially collapsed Markov chain Monte Carlo algorithm is developed for posterior exploration based on a data augmentation scheme for the hinge loss. Our simulations and three real data examples demonstrate that the new approach is a strong competitor to some approaches that were proposed recently for dealing with challenging classification examples with high dimensionality.