Abstract
The convergent beam electron diffraction (CBED) technique, as well as the electron microdiffraction methods are currently used in analytical electron microscopy for materials characterization. These diffraction methods allow the identification of very small crystalline phases and tri-dimensional crystallographic analysis with high spatial resolution through the application of a very thin electron beam and wide diffraction angle through the specimen in a transmission electron microscope (TEM). Despite the wide range of analytical possibilities, its use in the characterization of ceramics, glass-ceramics and their raw materials has been scarce. Therefore, in this chapter are shown the basic principles of CBED as well as microdiffraction for the crystallographic analysis of ceramics both from our own research and by reviewing some examples of applications from the literature.
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