Abstract
This paper proposes the third generation wavelet--double tree complex wavelet (DT-CWT) transformation used in nanometer roughness rating, based on the explanation of the shortcomings of the current nanometer roughness rating reference and conventional three dimensional datum evaluations due to the insufficient study. The experiment got porous anodic alumina film as the object of surface roughness of nanotechnology study. Through the comparisons of the three generations of the wavelet reconstruction after the maximum reconstruction error, a conclusion can be made that the superiority of DT-CWT in application is very obvious, a result meeting the16% principle of the surface roughness rating on the bases of DT - CWT extracted datum to compute income parameters, which indicates the feasibility of this application to the extraction of the nano3-D roughness evaluation. Keywords: nanometer roughness;dual-tree complex wavelet;three dimensional datum
Published Version
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