Abstract
AbstractAn updated design of a band‐tunable flat crystal spectrometer is presented. The new configuration contributes to a broad spectral coverage with greater resolving power, a strong rejection of hard X‐ray backgrounds, and decreased sensitivity to source broadening for an extended source. To verify the performance of the spectrometer, spectral lines were measured using a potassium acid phthalate crystal for highly ionized species of aluminum or silicon, and the results were compared by measuring H‐ and He‐like Al and Si lines by rotating the crystal to selected Bragg angles, at the Shenguang II laser facility. The observed energy‐coverage range is consistent with the theoretical predictions, as well as with the measured spectral resolution of ~300.
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