Abstract
We report electrochemical CV measurement determination of the conduction band offset ΔEc of Ga 1−xAl xAs:Ga 1−yAl yAs heterojunctions (HJs) with x=0−0.21 and y≈0.4, as well as of In 0.53Ga 0.47As: InP HJs. The samples were grown by liquid phase epitaxy. We have obtained band offset ratios ΔEc/ΔEg≈0.6 and ΔEc/ΔEg≈0.36, respectively, for GaAlAs and InGaAs: InP HJs, where ΔEg is the HJ band gap energy difference. These results are consistent with recent data obtained by other techniques on similar HJs. In addition, the density of fixed interface charges are estimated and are apparently related to the doping of the large band gap layer of the HJ.
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