Abstract
We have measured the far-infrared reflectance of YBa2Cu3O7−δ high Tc superconducting (HTS) films, for radiation incident on the substrate side (back-side illumination), in the spectral region from 15 to 650 cm−1 and at temperatures between 10 and 300 K. The HTS films were deposited on Si substrates (with YSZ/CeO2 buffer layers) by pulsed laser ablation. The extremely large temperature dependence of the reflectance experimentally demonstrates the feasibility of using HTS films to construct far-infrared intensity modulators. In this letter, we present the measured results, as well as an analysis based on thin-film optics and a simple two-fluid model.
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