Abstract
AbstractWe developed a novel method to minimize the bezel of flexible displays through backside bonding of a chip on film, resulting in the bezel width of less than 500 μm as compared to 1000 μm of conventional displays. The metal embedded in polyimide (MEP) layer is placed between the first and second polyimide (PI) substrates and connected to the metal lines of the backplane via the MEP contact (M‐CNT) hole. Subsequently, the nonconductive film (NCF) bonding and intense pulsed light sintering are performed using conductive ink. Conductive ink as the interconnect material capable of low‐temperature sintering is applied to avert thermal degradation and crack. At a high temperature (65°C) and humidity (90% relative humidity), the contact resistance was a drivable level for the display after 240 h. The normalized strain in the M‐CNT hole and MEP area were less than 0.4, indicating the absence of cracks during the NCF bonding. These results demonstrated that the backside bonding method was suitable for extremely narrow bezels of the next‐generation flexible displays.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
