Abstract
Compton scattering in electron energy loss spectroscopy (EELS) is used to quantify the momentum distribution of occupied electronic states in a solid. The Compton signal is a broad feature with a width of several hundred eV. Furthermore, the weak intensity results in a low peak-to-background ratio. Removing the background under the Compton profile is therefore particularly challenging, especially if there is an overlap with EELS core loss edges. Here an empirical background subtraction routine is proposed that uses input data from a bright-field EELS spectrum that does not have a Compton signal. The routine allows for multiple elastic-inelastic scattering within the EELS collection angles. Background subtraction is demonstrated on a Compton profile in silicon that overlaps with the Si L-edge. Systematic errors in the method are also discussed.
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