Abstract
The background intensity Ibin the short-wave (0.065–0.15 nm) and long-wave (0.19–0.85 nm) X-ray regions is studied experimentally as a function of the particle size D(15–360 μm) for single-phase and multiphase samples. It is found that, for single-phase samples, Ibdecreases with D, and the effect is connected with the surface quality of the radiating sample. For multiphase samples, Ibin the short-wave region can either increase or decrease as Dincreases, depending on the wavelength and the sample composition. The causes of the effects observed are revealed. For multiphase samples, we found no well-defined regularity Ib= f(D) in the long-wave region.
Published Version
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