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https://doi.org/10.1109/mdat.2018.2799801
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Cite Journal: IEEE Design & Test |  Publication Date: Jun 1, 2018 |
 Citations: 8 |
Affiliation: Ehime University, Renesas Electronics (United States)
Power-on self-test is an efficient means for covering safety-critical faults in automotive systems. This paper presents a multicycle logic BIST technique that avoids fault masking after multiple cycles by sequential observation using a new scan cell structure. —Hans-Joachim Wunderlich, Universitat Stuttgart
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