Abstract
This study developed emissivity-compensated radiation thermometry. The principle of this method is based on the combined utilization of effective radiance and a specular reflection parameter. The former value is derived from multiple reflections of radiant flux between a specimen surface with an unknown spectral emissivity and a reflector. The latter value is derived from the reflection pattern of a specimen surface for incident light flux. The measurement system was composed of a radiation thermometer, a cylindrical cavity for multiple reflections, and a laser to obtain the specular reflection parameter. This system enabled the simultaneous measurement of temperature and emissivity of a specimen with any surface irregularities.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
