Abstract
A method and apparatus for plotting automatically the secondary electron emission yield curves from metals in an ultra-high vacuum environment are described. The yield curves from metals can be plotted in times of only a few seconds before the surfaces become contaminated. In addition, both the variation of the back-scattering coefficient with primary energy and the yield with angle of incidence of primaries may be plotted. Typical curves from Ni, Pt and Ta are presented to indicate the performance of the apparatus. Measurements using the apparatus are reported on the secondary electron emission characteristics of the three carbides TaC, TiC and ZrC as a function of primary energy and angle of incidence. In addition the yield curves are correlated with a theoretical universal yield curve.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
