Abstract
A preliminary study on an automated image analysis system for etched track counting is described in this short report. The system made a feature of full automation in the operation mode of automatic measurement. All the hardware components were commercially available except the specially-designed microscope control unit. The programs for autofocus and autoscanning, and for track measurement were all developed by our group. Tests with chemically etched α -particle tracks in CR-39 detectors showed that the agreement between the results of visual counting and that of automatic counting was acceptable. Improvement of software for track measurement is still in progress and the preliminary results are encouraging.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
