Abstract
In this paper, we investigate the impact of ultraviolet (UV) exposure on the bulk etch rate (Vb), track etch rate (Vt), and detector sensitivity of a CR-39 nuclear track detector. The study involves measuring the depths and diameters of alpha particle tracks in the CR-39 detector. The detectors were irradiated with alpha-particles with energy of 3.5 MeV after/or before being exposed to UV radiation at 366 nm for 6 h. The detectors were etched in a 6.25 N NaOH solution at 70 °C for periods of 1–7 h. The results showed that both Vb and Vt for CR-39 exhibited an enhancement when exposed to UV, where, the alpha-particle track diameters and depths increased with UV exposure. Moreover, the study revealed that the track formation time is decreased when the CR-39 detector was irradiated with UV light.
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Schedule a callMore From: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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