Abstract
An image-processing method combined with Fourier analysis is introduced in this work as a rapid and highly-automated method of detecting rear contact voids in passivated emitter and rear contact cells (PERC). This approach utilizes photoluminescence (PL) imaging to locate the central point of the most detrimental type of voids and associate a void fraction to each cell in a manner of seconds. Acoustic microscopy and scanning electron microscopy are also used as complementary tools to confirm the presence of voids detection using PL imaging and provide more insight into the actual physical mechanism of what is observed in PL measurements.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
