Abstract
Abstract A procedure for the automatic evaluation of ion-sensitive photographic plates used in spark source mass spectrography is described. Using an optical wedge microdensitometer the line-transmittance profiles are measured and stored. In a second step the transmittance profiles are converted into ion-intensity profiles, according to the equation of Franzen et al. [8], and inte-grated. The two methods, peak height and integrated intensities, are compared in terms of precison and accuracy.
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