Auger regeneration of the EL2 defect induced by the Debye tail in the space-charge region of a junction: Application to the so-called "optical regeneration"

Abstract

We have studied the regeneration of the EL2 defect, i.e., the transition from its metastable to its stable state, in n-type Schottky diode under zero bias. We show that this transition is induced by the so-called ``Auger regeneration,'' which occurs normally under injection of electrons in a junction. In our case, the regeneration is attributed to the free carriers of the Debye tail. A numerical simulation of the mechanism is proposed, in good agreement with the experimental data. Finally, we discuss the observed optical regeneration of EL2, which can be explained, at least in some cases, by an Auger mechanism, triggered by optically induced carriers.