Abstract
AbstractThe Auger parameter (AP) studies available in the literature are usually based on Auger transitions involving only core‐level electrons. In this paper, besides the usual AP − α*Z = [BE(2p)] + [KE(KL23L23)], (Z = third‐row chemical elements)—we also considered the AP involving core–valence–valence Auger transitions − γ*Z = [BE(2p)] + [KE(L23VV)]. The chemical shifts for γ* between Al0 and Al2O3 and between Si0 and SiO2 are more than twice that for α*, whereas the difference in such chemical shifts progressively decreases with increasing Z. While the inelastic mean free path (λ) associated with α* spans the range ∼2.5–4.5 nm, γ* relates to a much more surface‐specific analysis, i.e. 0.5 < λ < 2.5 nm. We discuss the diagnostic potential of γ* and outline its advantages and shortcomings in the surface and interface analysis of materials. Copyright © 2006 John Wiley & Sons, Ltd.
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