Abstract
Auger electron/X-ray photoelectron and cathodoluminescent (CL) spectroscopic studies were conducted on pulsed laser deposited SrAl2O4:Eu2+,Dy3+ thin films and the correlation between the surface chemical reactions and the decrease in the CL intensity was determined. The Auger electron and the CL data were collected simultaneously in a vacuum chamber either maintained at base pressure or backfilled with oxygen gas. The data were collected when the films were irradiated for 14h with 2keV electrons. The CL emission peak attributed to the 4f65d1→4f7 transitions was observed at ∼521nm and the CL intensity of the peaks degraded at different rates in different vacuum conditions. X-ray photoelectron spectroscopy (XPS) data collected from degraded films suggest that strontium oxide (SrO) and aliminium oxide (Al2O3) were formed on the surface of the film as a result of electron stimulated surface chemical reaction (ESSCR).
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