Abstract
Up until now there has been no direct method for detecting the electronic and magnetic structure of each atomic layer at the surface, which is an essential analysis technique for nanotechnology. For this purpose, we have developed a new method, diffraction spectroscopy, based on the photon energy dependence of the angular distribution of Auger electron emission. We have applied this method to analyze the magnetic structure of a Ni ultrathin film on a Cu(001) surface around the spin reorientation transition. Atomic-layer resolved x-ray absorption and magnetic circular dichroism spectra were obtained. Surface and interior core-level shifts and magnetic moments are determined for each atomic layer individually.
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