Abstract
Two types of planar defects are found in 0.95(Na0.5Bi0.5)TiO3–0.05BaTiO3 lead-free piezoelectric thin films prepared on polycrystalline Ni metal substrates. The atomic structures of these defects are characterized by means of aberration-corrected scanning transmission electron microscopy. The first type of planar defects is related to the (Bi2O2)2+ layers parallel to (100) plane of thin films. The second type of planar defects is determined as complex planar defects made up of edge-sharing TiO6 octahedra with the Bi cations residing in the cavities formed by the octahedral network. The formation of the Bi-rich defects is believed to affect the physical properties of the thin films.
Published Version
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