Atomic structure of the ultrathin alumina on NiAl(110) and its antiphase domain boundaries as seen by frequency modulation dynamic force microscopy

Abstract

Atomically resolved frequency modulation dynamic force microscopy (FM-DFM) images of the ultrathin alumina film on NiAl(110) are presented. Images show in detail the surface unit cell, both types of antiphase domain boundaries (translation-related domain boundaries) and lateral displacements within these types of boundaries. Due to the loss of translational symmetry at the boundary, structures of even increased complexity are revealed. Lateral models for these local arrangements have been created on the basis of adjusted unit cell structures. FM-DFM produces on this surface a contrast of extraordinarily high surface sensitivity. It matches the topmost oxygen layer even with respect to topographic height, which adds the third dimension to the analysis. With this the antiphase domain boundaries are shown to be shallow depressions. Furthermore, new symmetry aspects have been found in the topography of these boundaries. The local structure of the film surface shows evidence of substrate influence in its topography and the domain boundary network shows indications that its growth behaviour is affected by this interaction in its very details beyond sheer appearance. Presented results can be linked to the relation between growth and structure of an emerging class of structurally related ultrathin alumina films.