Abstract
Three-dimensional atom probe method (3DAP) coupled with field ion microscopy (FIM) was used to study the nano-scale boron segregation to dislocations in B2-ordered FeAl (40 at.% Al). A boron-rich Cottrell atmosphere near an edge 〈1 0 0〉 dislocation was imaged with atomic resolution and its chemical composition was analysed at local scale. Some macroscopic effects of boron segregation to crystal defects, which are related to the segregation phenomena, are also discussed.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
