Abstract
A brief overview is given on the use of scanning tunneling microscopy for the identification of surface species. The commonly applied theoretical models are summarized and some experimental details are given. As typical results constant current topographies of clean Si(111)7×7, the Ag/Si(111)7×7 and K/Si(111)7×7 systems are shown and discussed. Differences in the local density of states on clean and Ag-covered parts of Si(111)7×7 can be visualized by current images. The method is particularly suitable for an atomically resolved analysis of single-component adsorbate systems, where the adsorbate can be uniquely distinguished from the substrate.
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