Abstract
Atomic layer deposition (ALD) was used to fabricate an ytterbium (Yb)-doped silica fiber in combination with the conventional modified chemical vapor deposition (MCVD) method. An MCVD soot-preform with a porous layer of SiO<sub>2</sub> doped with GeO<sub>2</sub> was coated with layers of Yb<sub>2</sub>O<sub>3</sub> and Al<sub>2</sub>O<sub>3</sub> prior to sintering, using the ALD method. ALD is a surface controlled CVD-type process enabling thin film deposition over large substrates with good thickness control, uniformity and high conformality. A materials analysis study showed that the dopants successfully penetrated the full thickness of 320 μm of the soot layer. Preliminary preform and fiber experiments on refractive index profiles, background losses, lifetime and the characteristic gain-loss curve were performed demonstrating the potential of this method for fabricating Yb-doped fibers with high concentration of dopants.
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