Abstract
Atom-probe FIMs are micro-analytical devices of ultimate sensitivity by combining the single atom resolution of the field-ion microscope with the single particle detection of a mass spectrometer. The original ToF version may achieve a resolution ΔM/M of 1/200 and is thus adequate for routine metallurgical applications. The resolution is limited by an inadequate subnanosecond pulse front and can be improved tenfold in an energy deficit compensating ToF atom-probe. A magnetic sector also offers high resolution capability. New surface effects discovered by the atom-probe and affecting image interpretation in field-ion microscopy are the occurrence of up to fourfold charged metal ions as products of field evaporation, the field-induced adsorption of noble gases, and the formation of metal-helium molecular ions.
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