Assessing the Characterization for Multiple Cones and Cone Portions Utilizing X-Ray Diffraction in Single Point Incremental Forming

Abstract

<div>Single point incremental forming (SPIF) is a robust and new technique. In the recent research scenario, materials properties such as microstructure, micro-texture analysis, and crystal structure can be accessed through characterization non-destructive techniques, e.g., scanning electron microscope (SEM), electron backscattered diffraction (EBSD), and X-ray diffraction (XRD). XRD is a non-destructive method for analyzing the fine structure of materials. This study explores how process variables such as wall angle, step size, feed rate, and forming speed affect the parts of large-, medium-, and small-sized truncated cones of aluminum alloy AA3003-O sheet. Several cone parts of truncated cones are used in this investigation to implement Scherrer’s method. The two primary determining factors peak height and crystallite size are assessed for additional analysis in the present research. Observing and evaluating different types of large-, medium-, and small-sized truncated cones are to comprehend the thickness distribution, intensity, crystallinity, dislocation density, and micro strain affected by the forming depth at which they developed. The medium-sized truncated cones exhibit dual characteristics when employed as the middle and bottom for intensity, crystallinity, dislocation density, and micro strain.</div>