Abstract
This paper concentrates on the usage of the IEC 61000-4-20, the international standard for emission and immunity testing in transverse electromagnetic (TEM) waveguides. The specifications for transient testing in TEM waveguides according to Annex C of the norm are verified by measurements with different waveguides (GTEM 1250 and GTEM 3750) and various excitation signals with a large bandwidth up to several GHz. The measurement results show that the norm can be enlarged related to the defined limits of the applied test signals and the usable testing volume in the waveguide.
Full Text
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call