Abstract

We quantify the rates and total amounts of the arsenic for antimony exchange on both the Sb-terminated and Ga (or In)-terminated GaSb (001) surfaces using in situ real time line-of-sight mass spectrometry (LOS-MS) during molecular beam epitaxy. On the Sb-terminated GaSb (001) surface, an As for Sb exchange is observed to occur at all values of incident As2 flux considered. At high substrate temperature, three-dimensional (3D) nanometer-sized clusters from as a consequence of As/Sb exchange and lattice mismatch strain between GaAs and GaSb. The 3D clusters are found to have lateral dimensions of ∼10–30 nm and heights of 1–3 nm by atomic force microscopy (AFM). By contrast, at lower substrate temperatures a two-dimensional surface morphology is maintained, and AFM reveals an array of atomically flat terraces. On the surface terminated by one monolayer (ML) of Ga or In, there exists a critical As2 flux below which the As/Sb exchange is greatly diminished. The net amounts of Sb leaving the surface during one period of InAs/GaSb type-II superlattice growth are measured in real time by LOS-MS and estimated to be in the range of 0–0.4 ML for the various conditions used. By supplying only an As2 beam to a GaSb surface covered by InAs, the Sb riding over the InAs layer is replaced by arsenic and the total amount of such Sb is measured. The amount of Sb riding on the InAs can be as large as 0.8 ML for the first 1 ML of InAs and it gradually decreases to zero as the number of InAs monolayer increases. X-ray diffraction data show that all the InAs/GaSb superlattices coherently match with the GaSb substrate in the growth plane. The average lattice constant along the growth direction reduces with decreasing Sb mole fraction shown by the increased Sb desorption signal. Using the information on As/Sb exchange and Sb riding on the InAs surface, we predict an average lattice constant along the growth direction to be consistent with the measured one to within 2×10−4.

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