Abstract

This paper compares areas between a 6T and 8T SRAM cells, in a dual-Vdd scheme and a dynamic voltage scaling (DVS) scheme. In the dual-Vdd scheme, we predict that the area of the 6T cell keep smaller than that of the 8T cell, over feature technology nodes all down to 32 nm. In contrast, in the DVS scheme, the 8T cell will becomes superior to the 6T cell after the 32-nm node, in terms of the area.

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