Abstract
A variety of experiments have been performed which identify key factors contributing to the arcing of negatively biased high voltage solar cells operating in a low earth orbit plasma environment. These efforts have led to a reduction of greater than a factor of 100 in the arc frequency of a single cells following proper remeditation procedures. Experiments naturally led to and focused on the adhesive/encapsulating that is used to bond the protective cover slip to the solar cell. An image-intensified CCD camera system recorded UV emission from arc events which occurred exclusively along the interfacial edge between the cover slip and the solar cell. Microscopic inspection of this interfacial region showed a bead of encapsulant along this entire edge. Elimination of this encapsulant bead reduced the arc frequency by two orders of magnitude.
Published Version
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