Abstract
A standard two-circle diffractometer with a Ge(Li) solid-state detector controlled by a microcomputer has been constructed. Its characteristics [good signal-to-noise (s/n) ratio, simple optical collimation, without any monochromator or filter] are described. A single angle-dispersive scan with this system can give diffraction patterns with Kα, Kβ and fluorescence radiation simultaneously: diffractometry with the present system can be carried out in a shorter time than with a conventional diffractometer and a proportional or scintillation counter and will give a better s/n ratio. Powder or amorphous samples of small volume can be more easily studied with the present system; typical examples reported include crystalline InSb and amorphous GaSb, both in a diamond-anvil high-pressure cell.
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