Abstract
A new technique for diagnosis of faults in the interconnects and logic blocks of an arbitrary design implemented on an FPGA is presented. This work is complementary to application-dependent detection methods for FPGAs. This technique can uniquely identify any single bridging, open, or stuck-at fault in the interconnect as well as any single functional fault in the logic blocks. The number of test configurations for interconnect diagnosis is logarithmic to the size of the mapped design, whereas logic diagnosis is performed in only one test configuration.
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