Abstract
A correct perception of a link between the heavily charged particles parameters and radiation tolerance of very large integrated circuits is one of the main problems in design of electronic equipment for space applications. In the paper, methods of augmented/virtual reality applications for research of radiation damage on very large integrated circuits (VLSI) are introduced. A transfer function design for correct visual representation is discussed. In the paper, we assume transfer function transforms the number of particles damaging a chip to a colour from green to red. The red colour means that the chip has been damaged. The green image means the initial conditions. We discuss features of augmented reality realisation with minimal hardware requirements. Our tool can help engineers to compare alternative design solutions.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.