Abstract
The photometric method of fabric analysis is used to map variations in quartz c-axis fabrics in two folded quartzite specimens. The first specimen contains two isoclinal folds which were refolded in a later deformation. The quartz fabrics are interpreted as having been generated under a uniform strain environment during development of the isoclinal folds. During the later refolding the fabrics were passively rotated, together with the layering, about the new fold axes. In the second specimen the fabric patterns change in style around the fold and these changes are interpreted as related to the deformation. The advantages of the photometric method in fabric mapping are discussed.
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